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Created with Pixso. Multifunctional Rapid Thermal Conductivity Tester With HotDisk Method

Multifunctional Rapid Thermal Conductivity Tester With HotDisk Method

Model Number: GD-III
MOQ: 1 set
Price: USD 2000-4000
Delivery Time: 25 working days
Payment Terms: L/C,T/T,Western Union
Detail Information
Place of Origin:
China
Certification:
ISO
Product:
Multifunctional Rapid Thermal Conductivity Tester
Test Method:
Transient Plane Heat Source Method, HotDisk Method
Standard:
ISO 22007-2:2015, GB/T32064-2015
Thermal Conductivity Measurement Range:
0.001~500w/(m.k)
Thermal Conductivity Range:
0.1~100 M2/s
Thermal Resistance Range:
0.5~0.000005 Mm2.k/w
Packaging Details:
Plywood case
Supply Ability:
10 sets per month
Highlight:

Multifunctional thermal conductivity tester

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HotDisk thermal conductivity tester

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Rapid thermal conductivity analyzer

Product Description
Multifunctional Rapid Thermal Conductivity Tester With HotDisk Method
Multifunctional Rapid Thermal Conductivity Tester (Transient Plane Heat Source Method, HotDisk Method)
Multifunctional Rapid Thermal Conductivity Tester With HotDisk Method 0

This advanced instrument measures thermal conductivity, thermal diffusivity, specific heat capacity, heat storage coefficient, and thermal resistance for various materials including solids, rocks, powders, liquids, pastes, coatings, films, and anisotropic materials.

Overview

Utilizing the transient plane heat source method based on TPS technology with Hot Disk probes, this instrument offers significant advantages:

  • Direct measurement of heat propagation for time efficiency
  • Unaffected by contact thermal resistance issues common in static methods
  • Minimal sample preparation required - only relatively flat surfaces needed for solid materials
  • Custom test schemes and mathematical models for different material types
  • Fast measurement speed with wide application range
  • Successfully avoids natural convection influence during experiments

This method provides broad material compatibility, wide thermal conductivity range, simple sample processing, and rapid testing capabilities, making it a popular choice in thermal analysis.

Compliance Standards

ISO 22007-2:2015, GB/T32064-2015

Test Materials

Compatible with metals, alloys, graphite, thermal grease, silicone, silicone rubber, ceramics, geotechnical materials, rocks, polymers, paper, fabrics, foam plastics, concrete, composite panels, paper honeycomb panels, and various solids, powders, liquids, pastes, coatings, films, thermal insulation materials, insulating materials, and anisotropic materials.

Technical Specifications
Parameter Specification
Thermal Conductivity Range 0.001 - 500 W/(m·K), Resolution: 0.0001 W/(m·K)
Thermal Diffusivity Range 0.1 - 100 m²/s
Heat Storage Coefficient 0.1 - 30 W/(m²·K)
Specific Heat Capacity 0.1 - 5 kJ/(kg·℃)
Thermal Resistance Range 0.5 - 0.000005 mm²·K/W
Temperature Measurement Accuracy ≤ 0.001℃
Relative Measurement Error ≤ 3%
Repeatability Error ≤ 3%
Test Time 1 - 120 seconds
Sample Test Environment -40℃ to 150℃; -40℃ to 250℃ (Standard: Room Temperature)
Additional Configuration Options
  • Various high/low temperature control boxes (-40℃ to 250℃) or vacuum test states available (additional cost)
  • Probe diameters: Φ30mm, Φ15mm, Φ7.5mm, Φ4mm (temperature resistance -40℃ to 250℃)
  • Standard configuration: Φ15mm probe
Sample Requirements
  • Solid blocks or round/square/special-shaped samples require only relatively flat surfaces
  • Special sample clamping device provided
  • No special requirements for powders, pastes, or liquid substances
  • Special test sample box provided
  • Special test plans and mathematical models for:
    • Thin materials (0.01-1mm thickness)
    • High-conductivity materials (100-500W)
    • Thermal insulation materials (0.010-0.050W)
  • Uniaxial anisotropic test mode equipped
Software & Power Requirements
  • Fully automatic test software for rapid analysis of test process parameters and report generation
  • Power Supply: AC 220V ±10%, 50/60 Hz
  • Total Machine Power: < 500W
Multifunctional Rapid Thermal Conductivity Tester With HotDisk Method 1